S.M.A.R.T. (Smart Monitoring & Reporting Technology)
S.M.A.R.T. is a research
program for experimental monitoring and databasing of disk drive failure
warning data, for analysis by data mining and pattern recognition statistical
techniques. The program is sponsored by the UCSD Information
Storage Industry Center, a Sloan Foundation center.
The SMART program works with disk drive manufacturers on their SMART technology,
to assist them in enhancing its failure warning accuracy and failure warning
time, while reducing false alarms from good drives. Our long term goals
include drive reliability improvement, by SMART technology assessment
of individual drives during their manufacturing final test.
Significant SMART opportunities
exist for these enhancements. The failure warning accuracy of SMART is
estimated to average about 30% overall, in the disk drive industry today.
Up to 70% of drive failures occur too suddenly to predict, or are unmonitored
by today's SMART technology. Disk drive failure rates have remained nearly
constant at about 1% per year, and so the false alarm rate needs to be
kept at 0.1%-0.2% to minimize rejecting good drives.
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