S.M.A.R.T. (Smart Monitoring & Reporting Technology)
S.M.A.R.T. is a research
program for experimental monitoring and databasing of disk drive failure
warning data, for analysis by data mining and pattern recognition statistical
techniques. The program is sponsored by the UCSD Information
Storage Industry Center, a Sloan Foundation center.
The SMART program works with disk drive manufacturers on their SMART technology, to assist them in enhancing its failure warning accuracy and failure warning time, while reducing false alarms from good drives. Our long term goals include drive reliability improvement, by SMART technology assessment of individual drives during their manufacturing final test.
Significant SMART opportunities exist for these enhancements. The failure warning accuracy of SMART is estimated to average about 30% overall, in the disk drive industry today. Up to 70% of drive failures occur too suddenly to predict, or are unmonitored by today's SMART technology. Disk drive failure rates have remained nearly constant at about 1% per year, and so the false alarm rate needs to be kept at 0.1%-0.2% to minimize rejecting good drives. More.....